Frequency-dependent nanomechanical profiling for medical diagnosis
- Santiago D. Solares and
- Alexander X. Cartagena-Rivera
Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122
A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques
- Berkin Uluutku,
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79
Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
- Cameron H. Parvini,
- M. A. S. R. Saadi and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10
On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125
Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
- Cameron H. Parvini,
- M. A. S. R. Saadi and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 922–937, doi:10.3762/bjnano.11.77
Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
- Berkin Uluutku and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37
Artifacts in time-resolved Kelvin probe force microscopy
- Sascha Sadewasser,
- Nicoleta Nicoara and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2018, 9, 1272–1281, doi:10.3762/bjnano.9.119
Imaging of viscoelastic soft matter with small indentation using higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy
- Miead Nikfarjam,
- Enrique A. López-Guerra,
- Santiago D. Solares and
- Babak Eslami
Beilstein J. Nanotechnol. 2018, 9, 1116–1122, doi:10.3762/bjnano.9.103
Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223
High-stress study of bioinspired multifunctional PEDOT:PSS/nanoclay nanocomposites using AFM, SEM and numerical simulation
- Alfredo J. Diaz,
- Hanaul Noh,
- Tobias Meier and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 2069–2082, doi:10.3762/bjnano.8.207
Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy
- Hanaul Noh,
- Alfredo J. Diaz and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62
Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions
- Santiago D. Solares
Beilstein J. Nanotechnol. 2016, 7, 554–571, doi:10.3762/bjnano.7.49
A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy
- Santiago D. Solares
Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229
Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224
Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 1649–1663, doi:10.3762/bjnano.5.176
Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air
- Santiago D. Solares,
- Sangmin An and
- Christian J. Long
Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175
Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case
- Babak Eslami,
- Daniel Ebeling and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 1144–1151, doi:10.3762/bjnano.5.125
Challenges and complexities of multifrequency atomic force microscopy in liquid environments
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 298–307, doi:10.3762/bjnano.5.33
Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies
- Gheorghe Stan and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 278–288, doi:10.3762/bjnano.5.30
Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case
- Daniel Ebeling and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20
Towards 4-dimensional atomic force spectroscopy using the spectral inversion method
- Jeffrey C. Williams and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10
